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Reliability Issues for DOD Systems:

Report of a Workshop

Status: Available Now

Size: 104 pages, 6 x 9

Publication Year:2002

Print	List Price	Your Price

PAPERBACK ISBN-10: 0-309-08606-X ISBN-13: 978-0-309-08606-6	$28.25	$25.43	Add to Cart

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Authors:
Committee on National Statistics, Francisco Samaniego and Michael Cohen,Editors, National Research Council
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Table of Contents
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Front Matter	i-x
1. Introduction and Overview	1-9	(skim)
2. The Measurement and Management of Reliability Growth	10-34	(skim)
3. Current Research in Reliability Modeling and Inference	35-69	(skim)
4. Further Discussion and Next Steps	70-78	(skim)
References	79-82	(skim)
Appendix: Workshop Agenda and Participants	83-90	(skim)
Index	91-94	(skim)

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