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OCR for page 303
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001 Appendix E Acronyms and Abbreviations ADA— American Dental Association ADL— architecture description language AES— Advanced Encryption Standard AFM— atomic force microscopy/microscope AFST— Advanced Fire Services Technologies AML— Advanced Measurement Laboratory AMO— atomic, molecular, and optical AM&PM— Advanced Measurement and Prediction Methods ANSI— American National Standards Institute API— application programming interface ASME— American Society of Mechanical Engineers ASTM— American Society for Testing and Materials ATP— Advanced Technology Program BACnet— Building Automation and Control Network BEES— Building for Environmental and Economic Sustainability BFRL— Building and Fire Research Laboratory BIPM— Bureau International des Poids et Mésures CAD— computer-aided design CARB— Center for Advanced Research in Biotechnology CCCBDB— Computational Chemistry Comparison and Benchmark Database CCL— Consultative Committee on Length CCM— Consultative Committee for Mass and Related Quantities CCQM— Consultative Committee for the Amount of Substance CD— critical dimension; compact disk CHRNS— Center for High Resolution Neutron Scattering CIF— common industry format
OCR for page 304
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001 CIO— chief information officer CIPM— Comité International des Poids et Mésures CIRMS— Council on Ionizing Radiation Measurements and Standards CISPR— International Special Committee on Radio Interference CMM— coordinate measuring machine CONTAM— contaminant transport analysis computer program CORM— Council for Optical Radiation Measurements CPC— calcium phosphate cement CPCC— Ceramic Processing and Characterization Council CPTWG— Copyright Protection Technical Working Group CRADA— cooperative research and development agreement CRM— certified reference material CSEAT— Computer Security Expert Assist Team CSTL— Chemical Science and Technology Laboratory CVD— chemical vapor deposition DARPA— Defense Advanced Research Projects Agency DASE— digital TV application software environment DC— direct current DCS— disk chopper time-of-flight spectrometer DLMF— Digital Library of Mathematical Functions DMATS— Display Measurement Assessment Transfer Standard DMIS— dimensional measuring interface standard DNA— deoxyribonucleic acid DOD— Department of Defense DOE— Department of Energy DOT— Department of Transportation DRM— digital rights management DRS— diffuse reflectance spectrometer/spectrometry DTV— digital television DVD— digital versatile disk EBIT— electron-beam ion trap EEEL— Electronics and Electrical Engineering Laboratory EM— electromagnetic EMC— electromagnetic compatibility; Enhanced Machine Controller EPA— Environmental Protection Agency EPR— electron paramagnetic resonance ESR— electron spin resonance EUV— extreme ultraviolet FANS— filter analyzer neutron spectrometer FASCAL— Facility for Automatic Spectroradiometric Calibrations FAST— financial agent secure transactions FCS— Fermi chopper time-of-flight spectrometer FDA— Food and Drug Administration FDD— fault detection and diagnostics FDS— fire dynamics simulator
OCR for page 305
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001 FEMA— Federal Emergency Management Agency FERET— face recognition technology FIATECH— fully integrated and automated technologies FIB— focused ion beam FRP— fiber-reinforced polymer FTIR— Fourier transform infrared GaAs— gallium arsenide GAMS— Guide to Available Mathematical Software GEC— Gaseous Electronics Conference GMO— genetically modified organism GMR— giant magnetoresistance GPS— Global Positioning System HFBS— high-flux backscattering spectrometer HHI— Healthy Homes Initiative HPC— high-performance concrete HP-ICP-OES— high performance-inductively coupled plasma-optical emission spectrometry HTS— high-temperature superconductor HUD— Department of Housing and Urban Development HVAC— heating, ventilation, and air-conditioning IAEA— International Atomic Energy Agency IAV— Industrial Autonomous Vehicles IC— integrated circuit ICP— inductively coupled plasma IDEMA— International Disk Drive Equipment and Materials Association IEA— International Energy Agency IEC— International Electrotechnical Commission IEEE— Institute of Electrical and Electronics Engineers IETF— Internet Engineering Task Force IGBT— insulated gate bipolar transistors INAA— instrumental neutron activation analysis INO— inhaled nitric oxide IP— Internet Protocol; intellectual property IPsec— Internet Protocol Security IR— infrared ISO— International Organization for Standardization IT— information technology ITAP— IT architecture plan ITL— Information Technology Laboratory ITRS— International Technology Roadmap for Semiconductors ITSPT— Information Technology Services Planning Team IUPAC— International Union for Pure and Applied Chemistry IVI— Intelligent Vehicle Initiative JamPack— Java matrix package JEDEC— Joint Electron Device Engineering Council JPEG— Joint Photographic Experts Group MALDI— matrix-assisted laser desorption ionization
OCR for page 306
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001 MANET— mobile ad hoc network MBE— molecular beam epitaxy MEL— Manufacturing Engineering Laboratory MEMS— microelectromechanical systems MERLiN— modeling, evaluation, and research of lightwave networks MMS— Minerals Management Service MPEC— Motion Picture Experts Group MPLS— multiprotocol label switching MRA— Mutual Recognition Agreement MRAM— magnetic random access memory MS— mass spectrometry/spectrometer MSEL— Materials Science and Engineering Laboratory MSL— Measurement and Standards Laboratories NAAQS— National Ambient Air Quality Standards NASA— National Aeronautics and Space Administration NCNR— NIST Center for Neutron Research NCSLI— National Conference of Standards Laboratories International NEI— Nuclear Energy Institute NFG— nonfederal government (agencies) NFPA— National Fire Protection Association NIAP— National Information Assurance Partnership NIH— National Institutes of Health NIJ— National Institute of Justice NIOF— Neutron Interferometry and Optics Facility NIST— National Institute of Standards and Technology NMI— national measurement institute NMR— nuclear magnetic resonance NOAA— National Oceanic and Atmospheric Administration NORAMET— North American Metrology Organization NRC— National Research Council NRS— nanoscale recording system NSE— neutron spin echo NSF— National Science Foundation NSIC— National Storage Industry Consortium NSMP— National Semiconductor Metrology Program NSOM— near-field scanning optical microscopy/microscope NSRL— National Software Reference Laboratory NTRM— NIST-Traceable Reference Material OA— other agencies OAE— Office of Applied Economics OASIS— Organization for the Advancement of Structured Information Standards OCAP— OpenCable Application Program OIDA— Optoelectronics Industry Development Association OLCI— optical low-coherence interferometer OLES— Office of Law Enforcement Standards OMP— Office of Microelectronics Programs
OCR for page 307
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001 OOF— object-oriented finite-element (analysis system) PATH— Partnership for Advancing Technologies in Housing PCASYS— pattern-level classification for automation system for fingerprints PDB— Protein Data Bank pdf— portable document format PDM— product data management PKI— public key infrastructure PL— Physics Laboratory PM— particulate matter PMD— polarization mode dispersion QD— quantum dot QPD— Quantum Physics Division RCS— real-time control systems REFLEAK— refrigerant mixture leakage behavior REML— RF-EM Field Metrology Laboratory RF— radio frequency RIF— reduction in force RIMS— resonance ionization mass spectrometry/spectrometer RNA— ribonucleic acid RRF— Reduced Risk of Flashover RTP— rapid thermal processing SANS— small-angle neutron scattering SCM— scanning capacitance microscopy/microscope SDMI— Secure Digital Music Initiative SEM— scanning electron microscopy/microscope SEMATECH— Semiconductor Manufacturing Technology Consortium SEMPA— scanning electron microscopy with polarization analysis SET— single-electron tunneling SHMOKE— second harmonic magneto-optic Kerr effect SI— International System (of units) SIA— Semiconductor Industry Association SIM— Sistema Interamericano Metrología SIP— session initiation protocol SIRCUS— spectral irradiance and radiance calibration with uniform sources SIS— superconductor-insulator-superconductor SQUID— superconducting quantum interference device SRAM— static random access memory SRD— Standard Reference Database SRM— Standard Reference Material STEP— standard(s) for the exchange of product model data STM— scanning tunneling microscopy/microscope STR— short tandem repeat STRS— Scientific and Technical Research and Services SURF— Synchrotron Ultraviolet Radiation Facility TBC— thermal barrier coating TEM— transmission electron microscopy/microscope
OCR for page 308
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001 TIA— Telecommunications Industries Association TIMS— thermal ionization mass spectrometry/spectrometer TOF— time of flight TRC— Thermodynamics Research Center TREC— Text Retrieval Conference UCN— ultracold neutron ULSI— ultralarge-scale integration USFA— U.S. Fire Administration UTC— coordinated universal time UTM— universal testing machine UV— ultraviolet UWB— ultrawideband VCBT— virtual cybernetic building testbed VCCTL— virtual cement and concrete testing laboratory WDM— wavelength division multiplexing XML— extensible markup language
Representative terms from entire chapter: