1969 Field ion microscopy of point defects. In Vacancies and Interstitials in Metals, pp. 557–73. Amsterdam: North-Holland.
1970 With S.V.Krishnaswami and S.B.McLane. Atom-probe FIM analysis of the interaction of the imaging gas with the surface. Surf. Sci. 23:112–29.
1972 The imaging process in field ion microscopy. J. Less Comm. Met. 28:37–50.
1973 Atom probes. Lab. Pract. 22:408–13. U.S. Patents 3,504,175 and 3,602,710.
With S.V.Krishnaswami. Energy spectrum of field ionization at a single atomic site. Surf. Sci. 36:29–47.
1974 With T.Sakurai. A magnetic sector atom-probe FIM. J. Vac. Sci. Technol. 11:899.
1975 With S.V.Krishnaswami. Aiming performance of the atom probe. Rev. Sci. Instrum. 46:1237–40.