1969 Field ion microscopy of point defects. In Vacancies and Interstitials in Metals, pp. 557–73. Amsterdam: North-Holland.

1970 With S.V.Krishnaswami and S.B.McLane. Atom-probe FIM analysis of the interaction of the imaging gas with the surface. Surf. Sci. 23:112–29.

1972 The imaging process in field ion microscopy. J. Less Comm. Met. 28:37–50.

1973 Atom probes. Lab. Pract. 22:408–13. U.S. Patents 3,504,175 and 3,602,710.

With S.V.Krishnaswami. Energy spectrum of field ionization at a single atomic site. Surf. Sci. 36:29–47.

1974 With T.Sakurai. A magnetic sector atom-probe FIM. J. Vac. Sci. Technol. 11:899.

1975 With S.V.Krishnaswami. Aiming performance of the atom probe. Rev. Sci. Instrum. 46:1237–40.



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