Basic, Applied, Development: Do We Need New Boundaries

Greg Tassey

NIST

 

Measurement Issues in a Changing Environment

Michael Gallaher

RTI

10:30-10:45

Break

10:45-12:00

Panel 2: Statistical Methodology Issues

 

Richard Valliant

Moderator

 

Developing a Quality Profile of the NSF Portfolio

Barbara Bailar

Consultant

 

Improving Survey Methodology

Jeri Mulrow

NSF

 

Research Agenda

Ray Wolfe

NSF

12:00-1:00

Lunch

01:00-3:00

Panel 3: Improving Measures of R&D Activity in Industry

Steve Klepper

Moderator

 

Census Bureau Perspective on Improving the RD-1 Survey

Bill Bostic

Census Bureau

 

Expanding the Collection of Data from Industry

Bill Long

BPRA Inc.

 

Collecting R&D Data from Businesses in Japan

Tomohiro Ijichi

University of Tokyo



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