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Elected in 1989

“For outstanding contributions to semiconductor memory technology.”


AL F. TASCH, JR., Cockrell Family Regents Chair Professor at the University of Texas at Austin and truly a giant in the semiconductor industry, passed away at Seton Medical Center in Austin on November 30, 2004. To many of us who knew him well, Al was a devoted husband, a loving father, a faithful friend, a staunchly devout man, and a great scientist and leader.

Al was born May 12, 1941, the son of Dr. Al F. and Dorothy Tasch. He received his B.S. degree in physics in 1963 from the University of Texas at Austin and his M.S. and Ph.D. degrees in physics in 1965 and 1969, respectively, from the University of Illinois, Urbana-Champaign. His thesis research in impurities in silicon was the pioneering work that led to the widely known deep-level transient spectroscopy for characterizing impurities in semiconductors, which is still used today worldwide. In 1969 he joined Texas Instruments, performing research that resulted in the first demonstration of a metal-insulator-semiconductor structure in mercury cadmium telluride, and he helped lay the foundation for infrared detector development and products throughout the 1970s and 1980s. He and his group did pioneering work in charge coupled device memories, dynamic memory, silicon on insulator, and scaled metal-oxide-semiconductor (MOS) transistors. Today’s industry-standard MOS transistor structure, used in countless

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