Due to rapidly increasing dielectric loss factor, the area of the sample that first exceeds the critical temperature will continue to heat rapidly at the exclusion of the rest of the sample. Thus, process control schemes to control thermal runaway depend upon knowing the temperature at the interior of the specimen. While it may be that precision is more important than accuracy for this control, many of the problems of temperature measurement discussed in Chapter 3 will influence the processor's ability to control the process. Moreover, in industrial practice, it is not usually possible to insert a thermocouple or optical probe into the specimen.



The National Academies | 500 Fifth St. N.W. | Washington, D.C. 20001
Copyright © National Academy of Sciences. All rights reserved.
Terms of Use and Privacy Statement