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Suggested Citation:"Participants." National Academy of Engineering. 1996. Foreign Participation in U.S. Research and Development: Asset or Liability?. Washington, DC: The National Academies Press. doi: 10.17226/4922.
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Page 183
Suggested Citation:"Participants." National Academy of Engineering. 1996. Foreign Participation in U.S. Research and Development: Asset or Liability?. Washington, DC: The National Academies Press. doi: 10.17226/4922.
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Page 184

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Participants Roundlable on Foreign Participation in U.S. Research and Development: Economic Asset or Liability? November 8-9, 1993 Reid Adler Special Assistant for Technology Transfer Policy National Institutes of Health Thomas Arrison Research Associate Office of Japan Affairs National Research Council Joseph Asbury Deputy to the Laboratory Director and Director of the Strategic Planning Group Argonne National Laboratory John Campbell Assistant Executive Director Office of International Affairs National Research Council Richard F. Celeste Celeste & Sabety Ltd. Robert A. Charpie Chairman Ampersand Ventures 183 Donald Crafts Acting Director, Office of International Investment U.S. Department of the Treasury C. Richard Deininger Director, National Resource Program SEMATECH John D. Donahue Assistant Secretary of Labor for Policy U.S. Department of Labor Geza Feketekuty Senior Policy Advisor Office of the U.S. Trade Representative Kenneth S. Flamm Principal Deputy Assistant Secretary of Defense and Special Assistant to the USDA Alexander Flax Senior Fellow National Academy of Engineering

184 C. William Gear President NEC Research Institute Howard J. Gobstein Vice President Association of American Universities David Goldston Committee on Science, Space and Technology U.S. House of Representatives John E. Gray Vice Chairman Atlantic Council of the United States Elton Kaufmann Associate Director of the Strategic Planning Group Argonne National Laboratory Karl E. Martersteck Vice President, AT&T Architecture AT&T Bell Laboratories Knut Merten President and CEO Siemens Corporate Research, Inc. William G. Morin Director, Technology Policy National Association of Manufacturers Joel Moses Dean of Engineering Massachusetts Institute of Technology James Murphy Senior Policy Advisor Office of the U.S. Trade Representative FOREIGN PARTICIPATION IN U.S. RESEARCH AND DEVELOPMENT Robert M. Nerem Parker H. Petit Professor for Engineering in Science Georgia Institute of Technology Alan Schriesheim Director and CEO Argonne National Laboratory Paul Reagan House Committee on Science, Space and Technology James J. Verrant Senior Vice President AlliedSignal Aerospace Pat Vroom Director of Technology Planning Siemens Corporate Research, Inc. Robert M. White President National Academy of Engineering John D. Wiley Dean of Graduate Studies and Vice President for Research University of Wisconsin, Madison John S. Wilson Board on Science, Technology and Economic Policy National Research Council NAE Staff Bruce Guile Director, Program Office Penny Gibbs Administrative Assistant

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During the past decade, foreign participation in U.S. research and development—through acquisition of R&D-intensive businesses, links with universities, and other arrangements—has expanded rapidly.

This emergence of foreign influence has drawn a mixed response—some regard the trend as a positive corollary to the expanding involvement of U.S.-owned companies in national markets abroad. Others consider it a net liability for Americans that often benefits foreign companies and their home economies at U.S. expense.

There exists a large gap in expert and public understanding of the drivers, nature, and consequences of foreign participation in the nation's technology enterprise. This volume seeks to close this gap and reviews:

  • The nature of R&D activities and how they contribute to economic development.
  • The causes, scope, and nature of foreign involvement in U.S.-based R&D activity and the associated costs, risks, benefits, and opportunities of this trend.
  • The merits and liabilities of policies to regulate foreign R&D participation.

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