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Contributors to This Volume PART I E. ABRAHAMS, Rutgers University P. W. ANDERSON, AT&T Bell Laboratories A. M. C~oGsToN, Los Alamos National Laboratory G. GAMOTA, University of Michigan, Ann Arbor F. E. JAMERSON, General Motors Research Laboratories D. C. SHAPERO, National Research Council L. R. TEsTARD', National Bureau of Standards S. WAGNER, Princeton University Chapter ~ M. L. COHEN, University of California, Berkeley H. EHRENREICH, Harvard University W. KOHN, University of California, Santa Barbara J. A. KRUMHANSE, Cornell University D. LANGRETH, Rutgers University J. C. PHILLIPS, AT&T Bell Laboratories E. W. PruMMER, University of Pennsylvania A. L. RUOFF, Cornell University D. SCHIFERL, Los Alamos National Laboratory J. R. ScHR~EFFER, University of California, Santa Barbara L. J. SHAM, University of California, San Diego 291

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292 CONTRIBUTORS J. SHANER, Los Alamos National Laboratory I. S~rvERA, Harvard University J. W. Watkins, Cornell University Chapter 2 B. J. ALDER, Lawrence Livermore National Laboratory N. ASHCROFT, Cornell University J. D. AXE, Brookhaven National Laboratory J. L. BIRMAN, City College of the City University of New York W. BRON, Indiana University G. BURNS, IBM Thomas J. Watson Research Center D. M. CEPERLEY, Lawrence Livermore National Laboratory R. Comas, Purdue University A. J. FREEMAN, Northwestern University F. GALEENER, Xerox Palo Alto Research Center B. N. HARMON, Iowa State University W. C. HERRING, Stanford University M. V. KLEIN, University of Illinois A. A. MARADuD~N, University of California, Irvine H. Marls, Brown University A. K. McMAHoN, Lawrence Livermore National Laboratory E. J. MELE, University of Pennsylvania D. L. Meads, University of California, Irvine V. NARAYANAMURTI, AT&T Bell Laboratories R. J. NEMAN~cH, Xerox Palo Alto Research Center G. E. PAKE, Xerox Corporation G. SHIRANE, Brookhaven National Laboratory M. F. THORPE, Michigan State University R. M. WHITE, Xerox Corporation J. P. WorFE, University of Illinois, Urbana R. ZALLEN, Virginia Polytechnic Institute and State University Chapter 3 C. KNos~ER, University of California, Los Angeles P. C. HOHENBERG, AT&T Bell Laboratories Chapter 4 J. C. BONNER, University of Rhode Island B. R. COOPER, West Virginia University C. Y. HUANG, Los Alamos National Laboratory I. S. JACOBS, General Electric Company V. KORENMAN, University of Maryland

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CONTRIBUTORS 293 D. P. LANDAU, University of Georgia R. E. PRANGE, University of Maryland S. ScHu~Tz, University of California, San Diego D. J. SEEEMYER, University of Nebraska Chapter 5 M. BRODSKY, IBM Thomas J. Watson Research Center J. DEMUTH, IBM Thomas J. Watson Research Center A. Fow~ER, IBM Thomas J. Watson Research Center F. HIMPSEL, IBM Thomas J. Watson Research Center N. Ho~oNYAK, JR., University of Illinois, Urbana T. Ho, IBM Thomas J. Watson Research Center N. D. LANG, IBM Thomas J. Watson Research Center K. PANDEY, IBM Thomas J. Watson Research Center S. PANTE~DEs, IBM Thomas J. Watson Research Center K. To, IBM Thomas J. Watson Research Center A. Warms, IBM Thomas J. Watson Research Center Chapter 6 J. M. Cowboy, University of Arizona, Tempe A. V. GRANATO, University of Illinois, Urbana G. JAcucc', University of Trento, Italy N. L. PETERSON, Argonne National Laboratory Chapter 7 M. CAR Do, AT&T Bell Laboratories D. HAMANN, AT&T Bell Laboratories E. W. PRIMMER, University of Pennsylvania T. Roomy, Cornell University A. J. S~EvERs, Cornell University S. Y. TONG, University of Wisconsin J. TULLY, AT&T Bell Laboratories M. B. WEBB, University of Wisconsin Chapter ~ T. BEREINCOURT, Office of Naval Research R. BUHRMAN, Cornell University B. MAPLE, University of California, San Diego C. VARMA, AT&T Bell Laboratories Chapter 9 N. ASHCROFT, Cornell University J. A. BARKER, IBM San Jose Research Laboratory

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294 CONTRIBUTORS E. G. D. COHEN, Rockefeller University R. J. DoNNEr~Y, University of Oregon G. EVANS, Oregon State University W. GELBART, University of California, Los Angeles J. KEsT~N, Brown University R. McPHA~, University of California, Los Angeles R. MEYER, Brandeis University R. L. SCOTT, University of California, Los Angeles G. STELL, State University of New York, Stony Brook Chapter 10 A. HEEGER, University of California, Santa Barbara E. HELFAND, AT&T Bell Laboratories R. STEIN, University of Massachusetts, Amherst Chapter 11 G. AH~ERs, University of California, Santa Barbara R. P. BEHRINGER, Duke University F. H. BUSSE, University of California, Los Angeles R. J. DoNNE~Y, University of Oregon J. D. FARMER, Los Alamos National Laboratory J. FORD, Georgia Institute of Technology P. C. HOHENBERG, AT&T Bell Laboratories B. A. HUBERMAN, Xerox Corporation J. S. LANGER, University of California, Santa Barbara A. L'scHAsER, University of Chicago L. P. KADANOFF, University of Chicago P. C. MARTIN, Harvard University J. McLAuGHE~N, Clarkson College A. C. NEwE~, University of Arizona H. L. Sw~NNEY, University of Texas, Austin R. W. WALDEN, AT&T Bell Laboratories Appendix D R. BREWER, IBM San Jose Research Center Y. R. SHEN, University of California, Berkeley J. J. WYNNE, IBM Thomas J. Watson Research Center Appendix E J. M. Cow~EY, Arizona State University V. JAccAR'No, University of California, Santa Barbara J. ROWE, University of Florida