. "Appendix E: Acronyms and Abbreviations." An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2000. Washington, DC: The National Academies Press, 2000.
The following HTML text is provided to enhance online
readability. Many aspects of typography translate only awkwardly to HTML.
Please use the page image
as the authoritative form to ensure accuracy.
An Assessment of the NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY MEASUREMENT AND STANDARDS LABORATORIES: Fiscal Year 2000
BIPM—
Bureau International des Poids et Mésures
BMCD—
Biological Macromolecule Crystallization Database
CAD—
computer-aided design
CAM—
computer-aided manufacturing
CBS—
Cybernetic Building Systems
CCD—
charge-coupled device
CD—
critical dimension
CHRNS—
Center for High Resolution Neutron Scattering
CIKS—
computer-integrated knowledge systems
CIP—
critical infrastructure protection
CIRMS—
Council on Ionizing Radiation Measurements and Standards
CIS(2)—
CIMSteel Standard (American Institute for Steel Construction)
CISPR—
International Special Committee on Radio Interference
CMM—
coordinate measuring machine
CMOS—
complementary metal oxide semiconductor
CONSiAT—
Construction Integration and Automation Technologies
CRADA—
Cooperative Research and Development Agreement
CRDS—
cavity ring-down spectrometry
CRT—
cathode ray tube
CSTL—
Chemical Science and Technology Laboratory
CTCMS—
Center for Theoretical and Computational Materials Science