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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling.

Testing at the Speed of Light evaluates the nation’s current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

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Suggested Citation

National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press. https://doi.org/10.17226/24993.

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Publication Info

88 pages |  8.5 x 11 | 

ISBNs: 
  • Paperback:  978-0-309-47079-7
  • Ebook:  978-0-309-47082-7
DOI: https://doi.org/10.17226/24993
Chapters skim
Front Matter i-xii
Summary 1-7
1 Introduction 8-11
2 The Space Radiation Environment and Its Effect on Electronics 12-19
3 Current State of Single-Event Effects Hardness Assurance and Infrastructure 20-43
4 Future Infrastructure Needs 44-50
5 A Path Toward the Future 51-58
Appendixes 59-60
Appendix A: Statement of Task 61-61
Appendix B: Single-Event Effects Testing Facilities in the United States 62-64
Appendix C: Acronyms 65-67
Appendix D: Sources for Further Reading 68-69
Appendix E: Committee and Staff Biographies 70-74
Appendix F: Speakers Before the Committee 75-76

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