TESTING AT THE
SPEED OF LIGHT
THE STATE OF U.S. ELECTRONIC PARTS
SPACE RADIATION TESTING INFRASTRUCTURE
Committee on Space Radiation Effects Testing Infrastructure
for the U.S. Space Program
National Materials and Manufacturing Board
Division on Engineering and Physical Sciences
A Consensus Study Report of
THE NATIONAL ACADEMIES PRESS
Washington, DC
www.nap.edu
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This study was supported by Contract No. DE-EP0000026/DE-DT0012373 with the Department of Energy. Any opinions, findings, conclusions, or recommendations expressed in this publication do not necessarily reflect the views of any organization or agency that provided support for the project.
International Standard Book Number-13: 978-0-309-47079-7
International Standard Book Number-10: 0-309-47079-X
Digital Object Identifier: https://doi.org/10.17226/24993
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Suggested citation: National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Radiation Testing Infrastructure. Washington, DC: The National Academies Press. doi: https://doi.org/10.17226/24993.
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COMMITTEE ON SPACE RADIATION EFFECTS TESTING INFRASTRUCTURE FOR THE U.S. SPACE PROGRAM
BHAVYA LAL, IDA Science and Technology Policy Institute, Co-Chair
PAUL D. NIELSEN, NAE,1 Software Engineering Institute, Co-Chair
ARDEN L. BEMENT, JR., NAE, Global Policy Research Institute
JAMES BURCH, Southwest Research Institute
HENRY B. GARRETT, California Institute of Technology, Jet Propulsion Laboratory (Retired)
JAMES HARRIS, NAE, Stanford University
SANDRA L. HYLAND, Northrop Grumman Corporation
LINDA KATEHI, NAE, University of California, Davis
RAY LADBURY, NASA Goddard Space Flight Center
JOE MAZUR, The Aerospace Corporation
LEONARD ROCKETT, Technology Metrics, LLC
RON TURNER, Analytic Services
Staff
DWAYNE A. DAY, Senior Program Officer, Study Director
ERIK B. SVEDBERG, Senior Program Officer
NEERAJ P. GORKHALY, Associate Program Officer
HEATHER LOZOWSKI, Financial Associate
JOSEPH PALMER, Senior Project Assistant
HENRY KO, Research Associate
___________________
1 Member, National Academy of Engineering.
NATIONAL MATERIALS AND MANUFACTURING BOARD
CELIA I. MERZBACHER, Semiconductor Research Corporation, Chair
RODNEY C. ADKINS, NAE,1 IBM Corporate Strategy
JIM C.I. CHANG, National Cheng Kung University, North Carolina State University
LEO CHRISTODOULOU, Boeing, Inc.
TOM DONNELLAN, Pennsylvania State University
ERICA FUCHS, Carnegie Mellon University
STEPHEN FORREST, NAS2/NAE, University of Michigan
JACK HU, NAE, University of Michigan
THERESA KOTANCHECK, Evolved Analytics, LLC
DAVID LARBALESTIER, NAE, Florida State University
ROBERT MILLER, IBM Almaden Research Center
EDWARD MORRIS, National Center for Defense Manufacturing and Machining, America Makes: The National Additive Manufacturing Innovation Institute
NICHOLAS A. PEPPAS, NAE/NAM,3 University of Texas, Austin
TRESA POLLOCK, NAE, University of California, Santa Barbara
F. STAN SETTLES, NAE, University of Southern California
HAYDN G. WADLEY, University of Virginia
BEN WANG, Georgia Institute of Technology
STEVE ZINKLE, NAE, University of Tennessee, Knoxville
Staff
JAMES LANCASTER, Acting Director
ERIK B. SVEDBERG, Senior Program Officer
HEATHER LOZOWSKI, Financial Associate
NEERAJ P. GORKHALY, Associate Program Officer
JOSEPH PALMER, Senior Project Assistant
HENRY KO, Research Assistant
___________________
1 Member, National Academy of Engineering.
2 Member, National Academy of Sciences.
3 Member, National Academy of Medicine.
Preface
In fall 2016, the Department of Energy, with NASA and U.S. Air Force support, asked the National Academies of Sciences, Engineering, and Medicine to undertake a study on the testing facilities in the United States for radiation-hardened electronics for spacecraft. The statement of task is included as Appendix A. The Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program met four times, in March, May, August, and October, and produced this report, which entered review in November 2017.
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Acknowledgment of Reviewers
This Consensus Study Report was reviewed in draft form by individuals chosen for their diverse perspectives and technical expertise. The purpose of this independent review is to provide candid and critical comments that will assist the National Academies of Sciences, Engineering, and Medicine in making each published report as sound as possible and to ensure that it meets the institutional standards for quality, objectivity, evidence, and responsiveness to the study charge. The review comments and draft manuscript remain confidential to protect the integrity of the deliberative process.
We thank the following individuals for their review of this report:
Scott Anderson, Lockheed Martin,
Steven J. Battel, NAE,1 Battel Engineering,
Ethan Cascio, Francis H. Burr Proton Therapy Center,
Henry L. Clark, Texas A&M University,
Jeff Hopkins, Astrobotic,
Barbara Jacak, NAS,2 Lawrence Berkeley National Laboratory,
Sam Kayali, Jet Propulsion Laboratory,
John Mather, NAS, NASA Goddard Space Flight Center,
Larry Phair, Lawrence Berkeley National Laboratory,
Heather Quinn, Los Alamos National Laboratory, and
Michael Sivertz, Brookhaven National Laboratory, NASA Space Radiation Laboratory.
Although the reviewers listed above provided many constructive comments and suggestions, they were not asked to endorse the conclusions or the recommendations of this report nor did they see the final draft before its release. The review of this report was overseen by Julia M. Phillips, NAE, Sandia National Laboratories (retired). She was responsible for making certain that an independent examination of this report was carried out in accordance with the standards of the National Academies and that all review comments were carefully considered. Responsibility for the final content rests entirely with the authoring committee and the National Academies.
___________________
1 Member, National Academy of Engineering.
2 Member, National Academy of Sciences.
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Contents
2 THE SPACE RADIATION ENVIRONMENT AND ITS EFFECT ON ELECTRONICS
Extraterrestrial Trapped Radiation
Impacts of Single-Event Effects on Spacecraft
3 CURRENT STATE OF SINGLE-EVENT EFFECTS HARDNESS ASSURANCE AND INFRASTRUCTURE
Radiation Hardness Assurance Approach
Single-Event Effects Hardness Assurance
Test Methods for Different Single-Event Effect Modes
Texas A&M University Cyclotron Facility
Lawrence Berkeley National Laboratory
NASA Space Radiation Laboratory
National Superconducting Cyclotron Laboratory at Michigan State University
Other Single-Event Effect Test Facilities and Techniques
Summary Single-Event Effect Test Facilities and Techniques
Single-Event Effect Propagation from the Device to the System Level
Body of Knowledge of Single-Event Effect Modes for Available Semiconductor Technologies
Status of Radiation Effects Workforce
A Field Under Increasing Stress
The Changing Electronics Landscape
The Impact on Testing Infrastructure
Potential Approaches to Reducing the Pressure on Testing Infrastructure
Verification, Testing, and Qualification Methodologies
B Single-Event Effects Testing Facilities in the United States