APPENDIX A
Workshop Agendas
FIRST WORKSHOP MEETING OCTOBER 22, 1996 NATIONAL RESEARCH COUNCIL WASHINGTON, D.C.
8:30 |
Introductions and Session Objectives Gary Baum, Panel Chair |
Industry Needs in Process Controls
8:45 |
Advanced Sensor Needs for the Glass Industry C. Philip Ross, Creative Opportunities |
9:30 |
Process Control and Sensor Needs: The Chemical Industry Mel Koch, University of Washington |
10:15 |
BREAK |
10:30 |
Sensor and Control Needs for the Metal Casting Industry Bill Walkington, Consultant |
11:15 |
Forest Products Industry: An Overview of Needs in Process Control Robert Bareiss, Bareiss Associates |
12:00 |
LUNCH |
1:00 |
A Compilation of Sensor and Control Needs John Green, The Aluminum Association |
1:45 |
Process Sensor and Control Needs in the Steel Industry Barry Brusey and Mike Dudzic, Dofasco |
2:30 |
BREAK |
Discussion of Common Industry Needs
3:30 |
Processes (Types and Conditions) All |
4:00 |
Process Control Needs All |
4:30 |
Process Monitoring Sensor Needs All |
5:00 |
ADJOURN |
SECOND WORKSHOP MEETING MAY 29, 1997 NATIONAL ACADEMY OF SCIENCES WASHINGTON, D.C.
8:30 |
Study and Session Objectives Gary Baum, Panel Chair |
8:45 |
“Intelligent” Process Controls: An Industrial Perspective Tariq Samad, Honeywell |
9:30 |
Neural Net Computing: A Perspective on Its Role as an Enabling Technology for Process Control in the Industries of the Future Yoh-Han Pao, AIWARE, Inc. |
10:15 |
BREAK |
10:35 |
Open-Architecture Controllers Fred Proctor, National Institute for Standards and Technology |
11:20 |
Process Optimization and Control Rush Robinett, Sandia National Laboratory |
12:05 |
LUNCH |
12:45 |
Strategic Directions for Improving Energy Efficiency within the Manufacturing Sector through Improved Harsh Environment Process Measurements David Holcomb, Oak Ridge National Laboratory |
1:30 |
Advanced Sensing Technologies for Industrial Process Controls Arlene Garrison, University of Tennessee |
2:15 |
Applications of Raman Optical Sensing for Industrial Process Monitoring and Control Michael Carrabba, EIC Laboratories |
3:00 |
Advanced Sensors for Monitoring Processes Mel Koch, University of Washington |
3:45 |
Wrap-up Discussions All |
4:15 |
ADJOURN |