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Pages 80-85

The Chapter Skim interface presents what we've algorithmically identified as the most significant single chunk of text within every page in the chapter.
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From page 80...
... 80 1. Scope 1.1 This standard covers the determination of aggregate characteristics using gradation and shape, angularity, and texture analysis determined by means of image analysis.
From page 81...
... 81 3.2.2 Flat and Elongated -- those particles having a ratio of longest dimension to shortest dimension greater than a specified value. Flatness Ratio (2)
From page 82...
... 82 including a visual image taken under fluorescent light, an image taken under the infrared laser with a wavelength of 805 nm while keeping OSW switch at Port 2, and an image under the red laser with a wavelength of 675 nm while keeping OSW switch at Port 1. 7.1.4 In the interface of SXV, select "Histogram" to check for correct exposure level.
From page 83...
... 83 and is used to remove small variations in background. Entering a value of 50 will force the program to ignore background variations smaller than 50 pixels in diameter.
From page 84...
... 84 conf., and N calculated in the table representation in Figure D-5. If the program selected the wrong value of N, replace it with the correct one shown in Figure D-5.
From page 85...
... 85 7.2.8 Enter the tray height as measured by micrometer in step 7.1.2. Press the "Relative Z" button to convert to relative surface height.

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