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3 BEAM TECHNOLOGIES
Pages 9-32

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From page 9...
... The use of microwave electron cyclotron resonance plasmas, a recent technique receiving much attention in semiconductor processing, is also reviewed. Ion beams are considered in a subsequent section.
From page 10...
... The direct evaporation process, using electron beam or thermal evaporation techniques (see Figure 3-1) , has been successfuly used for preparing transition meal carbides, silicides' and borides (Maissel and Glang, 1970; Bubhani et al., 1984; Yokotsuka et al., 1987~.
From page 11...
... Direct Reactive Evaporation Processes The reactive evaporation (RE) process is used to compensate for the loss of gaseous constituents of a ceramic during its direct evaporation.
From page 12...
... To avoid these problems, the reactive evaporation process is commonly used in a mode where the metallic constituent of the ceramic is evaporated in a partial pressure of the reactive gas to form a compound in the gas phase, or on the substrate, as a result of a reaction between the metal vapor and the gas atoms (e.g.' 4A1 + 3O2 ~ 2AI2O3~. The reactive evaporation method has been used to synthesize films of SnO2, SnInO3, In2O3, A12O3, Sick, CUxMo6O~' Y2O3, and TiO2' and' more recently, YBa2Cu3O7 x-type perovskite superconductors.
From page 13...
... Reactive Sputtering Processes The tic magnetron sputtering technique has been successfully used to deposit films of transition metal silicides and borides using a composite ceramic target. As in the case of evaporation, however, sputtering leads to dissociation of the target material into atoms and molecular fragments, which results in a deficiency of the gaseous constituents of the material.
From page 14...
... Recently, many different approaches have been proposed to overcome the poisoning problem. They involve maintaining a composition gradient in the gas phase by injecting the reactive gas near the substrate where the film forms and maintaining the working gas for sputtering near the source; using getters to trap the reactive gas to reduce the amount reaching the target; using conductance-limiting baffles between the target and substrate; controlling the gas composition, relative to the metal sputtering rate, with the use of mass spectrometric sensors in a feedback mode; and creating ~ second plasma near the substrate to activate the compound-forming reactions and combinations.
From page 15...
... Ion Beam Sputtering Processes In the basic ion beam sputtering process, an energetically well-characterized beam of inert gas ions, generated from an ion source, bombards the target to be sputtered. In the case of electrically insulating targets, neutral beams are used.
From page 16...
... 16 Table 3-1 Ceramic Films Prepared by Reactive Ion Beam Sputtering Ceramic Compound | Beam Energy Target Material | Gases (keV) AIN ~ Dual beam ~ Al ~ Ar and N Ar+(1.5)
From page 17...
... Molecular beam epitaxy is a term used to denote the epitaxial film deposition process involving the reaction of one or more thermal-molecular beams with a crystalline substrate surface under vacuum conditions (Parker, 1985~. The conventional MBE process is related to vacuum evaporation, but in additior~ it offers very precise control over the incident atomic or molecular fluxes while the substrate is held at a precisely determined temperature (under ultrahigh vacuum conditions)
From page 18...
... . The capability to grow single-crystal films with atomic-layer dimensional precision and with abrupt interfaces for complex structures makes MBE a unique crystal growth technology for the fabrication of future-generation microwave and optoelectronic devices.
From page 19...
... Also' since the dissociation reactions occur on the surface of the substrate itself, the conventional CVD process does not have the line-of-sight limitation of the PVD processes. With CVD, all parts of an irregularly shaped substrate are coated uniformly provided the temperature and gas flow conditions are the same everywhere.
From page 20...
... , the Si/N ratio, and the stress state of the plasma CVD-prepared silicon nitride are highly sensitive to the amount of bonded hydrogen in the material and the degree of ion bombardment during film growth (Bubhani et al., 1984~. Apart from silicon nitride' the PACVD technique has been used to deposit a wide range of other ceramic materials.
From page 21...
... , with the deposition temperature and precursor molecules, is given in Table 3-3. Microwave Electron Cyclotron Resonance Plasmas In the past several years electron cyclotron resonance (ECR)
From page 22...
... Table 3-3 Ceramic Materials Produced by CVD Coating Chemical Mixturc Deposition Temp.
From page 23...
... High rates of etching and deposition result from high plasma density, higher than in conventional reactive ion etching (RIE) and plasma deposition systems.
From page 24...
... In addition, the technology is ideally suited for modifying surface properties of materials in a wide variety of applications, ranging from biomaterials to aerospace applications. For classification purposes, ion beams can be divided into the following three categories: · Low-energy ion beams (below 1 Key)
From page 25...
... Owing to the high-intensity characteristic of focused laser beams, their effects often require only short interaction times. Thus, substitution of a laser processing step for the slow processing step in a continuous flow or transfer station system may be an effective strategy for improving productivity.
From page 26...
... sources have been used extensively in industry for vacuum melting, evaporation, welding, surface conditioning, and machining since the late l950s; the initial applications were in welding and melting (Bakish, 1962; Bunshah and Cocca, 1968; Schiller et al., 19761. The electron beam is a very high efficiency energy source as compared to other sources such as lasers, radiation, and electromagnetic induction.
From page 27...
... , which allows melting and superheating of the materials at a rate consistent with its impurity content to effect optimum refinement. ~ Beam intensity, focus, shape, and position are controllable precisely and almost instantaneously, which makes programming an electron beam process, such as machining, straight forward.
From page 28...
... Microwave Beams Microwave beams are not generally feasible power sources for use in normal processing schemes since the typical wavelengths (~) of 30- to 100-GHz energy (wavelengths of 1 cm to 3 mm, respectively)
From page 30...
... 1988. A New Ultrafine Groove Fabrication Method Utlizing Electron Cyclotron Resonance Plasma Deposition and Reactive Ion Etching.
From page 31...
... 1987. Low-Temperature Film Growth of Si by Reactive Ion Beam Deposition.


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