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Suggested Citation:"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press. doi: 10.17226/24993.
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C
Acronyms

ADC analog-to-digital converter
APL approach, proximity, and landing
ASIC application-specific integrated circuit
AU astronomical unit
CAD computer-aided design
CCD charge-coupled device
CME coronal mass ejection
CMOS complementary metal–oxide–semiconductor
CMUXE Center for Materials Under Extreme Environments
COTS commercial off the shelf
CRADA Cooperative Research and Development Agreement
DAC digital-to-analog converter
DC direct current
DDD displacement damage dose
DOD Department of Defense
DOE Department of Energy
DRAM dynamic random-access memory
DSEE destructive single-event effect
ESA European Space Agency
ESD electrostatic discharge
ESP Emission of Solar Protons
FDIR fault detection, isolation, and recovery
FOM figure of merit
FPGA field-programmable gate array
FRIB Facility for Rare Ion Beams
Suggested Citation:"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press. doi: 10.17226/24993.
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FY fiscal year
GCR galactic cosmic rays
GEO geostationary orbit
GeV gigaelectionvolt
GNC guidance, navigation, and control
HA hardness assurance
HZE high (H) atomic number (Z) and energy (E)
IEEE Institute of Electrical and Electronics Engineers
IoT Internet of Things
ISS International Space Station
IUCF Indiana University Cyclotron Facility
JPL Jet Propulsion Laboratory
LANL Los Alamos National Laboratory
LBNL Lawrence Berkeley National Laboratory
LED light-emitting diode
LEO low Earth orbit
LET linear energy transfer
M&O microelectronic and optoelectronic
M&S modeling and simulation
MBMA Model-Based Mission Assurance
MBSE Model-Based Systems Engineering
MBU multi-bit upset
MC Monte Carlo
MCU multi-cell upset
MeV million electron volts
MIBL Michigan Ion Beam Laboratory
MIT Massachusetts Institute of Technology
MMOD micrometeoroids and orbital debris
MOOC massive open online course
MOSFET metal-oxide-semiconductor field-effect transistor
MRED Monte Carlo Radiative Energy Deposition
NASA National Aeronautics and Space Administration
NEPP NASA Electronic Parts and Packaging
NRL Naval Research Laboratory
NSCL National Superconducting Cyclotron Laboratory
NSREC Nuclear and Space Radiation Effects Conference
NSRL NASA Space Radiation Laboratory
NSRSS NASA Space Radiation Summer School
ORSORT Oak Ridge School of Reactor Technology
PSYCHIC Prediction of Solar Particle Yields for Characterizing Integrated Circuits
Suggested Citation:"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press. doi: 10.17226/24993.
×
RADECS Radiation and its Effects on Components and Systems
RF radio frequency
RPP rectangular parallelepiped
SDRAM synchronous dynamic random-access memory
SEB single-event burnout
SEE single-event effect
SEFI single-event functional interrupt
SEGR single-event gate rupture
SEL single-event latchup
SEP solar energetic particle
SET single-event transient
SEU single-event upset
SEUTF Brookhaven SEU Test Facility
SMD standard microcircuit drawing
SOA safe operating area
SPE solar particle event
SRAM static random-access memory
TAMU Texas A&M University
TID total ionizing dose
UC University of California
Suggested Citation:"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press. doi: 10.17226/24993.
×
Page 65
Suggested Citation:"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press. doi: 10.17226/24993.
×
Page 66
Suggested Citation:"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press. doi: 10.17226/24993.
×
Page 67
Next: Appendix D: Sources for Further Reading »
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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling.

Testing at the Speed of Light evaluates the nation’s current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

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