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INTRODUCTION. 9 focus is on materials with submicron-sized microstructure (with a characteristic length scale less than 100 nanometers), irrespective of the specific type of material or materials being considered. The scope of the present study includes what is known about metal, ceramic, and polymeric materials and their composites, but it deliberately avoids significant discussion of semiconductor and superconducter materials, electronic and optical properties of multilayers, and rapidly solidified materials, all of which have been adequately treated in previous NMAB publications (National Materials Advisory Board, 1980, 1983, 1988). REFERENCES Birringer, R., U. Herr, and H. Gleiter. 1986. Suppl. Trans. Jpn. Inst. Met. 27:431. Hench, L. L., and D. R. Ulrich, eds. 1984. Ultrastructure Processing of Ceramics, Glasses, and Composites. New York: John Wiley & Sons. Hench, L. L., and D. R. Ulrich, eds. 1986. Science of Ceramic Chemical Processing. New York: John Wiley & Sons. Karasz, F. E. 1985. International Conference on Ultrastructure in Organic and Inorganic Polymers. Final Report AFOSR 85-0314 (15 Sept. 1985-14 Feb. 1986). Mackenzie, J. D., and D. R. Ulrich, eds. 1988. Ultrastructure Processing of Advanced Ceramics. New York: John Wiley & Sons. National Materials Advisory Board. 1980. Amorphous and Metastable Microcrystalline Rapidly Solidified Alloys: Status and Potential. Report NMAB-358. Washington, D.C.: National Academy Press. National Materials Advisory Board. 1983. The Reliability of Multilayer Ceramic Capacitors . Report NMAB-400. Limited distribution, available from DTIC, Washington, D.C. National Materials Advisory Board. 1988. Process Challenges in Compound Semiconductors. Report NMAB-446. Washington, D.C.: National Academy Press.
INTRODUCTION. 10
