Research Opportunities for Materials with Ultrafine Microstructures (1989)

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CHARACTERIZATION METHODS. 67 of these materials, new or modified techniques need to be brought to bear in this area. Among the most promising characterization methods available at present are the field ion microscope (FIM), also with atom-probe capabilities, the scanning tunneling microscope (STM), also with atomic force probe capabilities, and such analytical methods as electron energy loss spectroscopy (EELS) utilizing ultrafine probe sizes. In the area of mechanical properties, nanoindenter studies of the elastic and plastic properties of nanophase materials should prove very useful. Clearly, the ability to synthesize and examine nanophase materials in situ under carefully controlled conditions, such as ultrahigh vacuum, will be necessary to fully elucidate their unique characteristics. The density of nanophase materials needs to be precisely measured, but even such an apparently simple measurement as this can be difficult to accomplish for these ultrafine-grained materials with their even finer-scaled porosity. Some success in using the BET method on nanocrystalline ceramics has been recently reported (Hahn et al., 1989). Absolute measurements of density via x-ray or neutron adsorption are also viable, but additional methods more easily applied are certainly needed. REFERENCES Chen, L. C., and F. Spaepen. 1988. Nature 336:366. Cowley, S. W. 1984. Catalytic Materials, ACS Symposium Series 218, p. 353. Washington, D. C.: American Chemical Society. Datye, A. K., and A. D. Logan. 1986. Proc. Electron Microscopy Soc., G. W. Bailey, ed. San Francisco: San Francisco Press. Epperson, J. E., R. W. Siegel, J. W. White, T. E. Klippert, A. Narayanasamy, J. A. Eastman, and F. Trouw. 1989. Mater. Res. Soc. Symp. Proc. 132:15. Hahn, H., J. Logas, H. J. Höfler, T. H. Bier, and R. S. Averback. 1989. Mater. Res. Soc. Symp. Proc. 132:35. Hanson, B. E., G. W. Wagner, R. J. Davis, and E. Motell. 1984. Inorg. Chem. 23:1635. Haubold, T., R. Birringer, B. Lengeler, and H. Gleiter. 1988. J. Less Common Metals, 145:557. Herr, V., J. Jing, R. Birringer, U. Gonser, and H. Gleiter. 1987. Appl. Phys. Lett. 50:472. 

CHARACTERIZATION METHODS. 68 Hort, E. 1986. Diplom Thesis, Universität des Saarländes, Saarbrücken, Germany. Klier, K. 1980. Vibrational Spectroscopy of Adsorbed Species. A. T. Bell and M. L. Hair, eds. Washington, D.C.: American Chemical Society. Kortum, G. 1969. Reflectance Spectroscopy: Principles, Methods, and Applications. Berlin: Springer-Verlag. Lyman, C. E. 1986. Ultramicroscopy 20:119. Lyman, C. E., A. Ferretti, and N. J. Long. 1984. Analysis of a Cu/Zn catalyst by electron energy loss spectroscopy. In Analytical Electron Microscopy, D. B. Williams and D. C. Joy, eds. San Francisco: San Francisco Press. Meitzner, G., G. H. Via, F. W. Lytle, and J. H. Sinfelt. 1985. J. Chem. Phys. 83:353. Melendres, C. A., A. Narayanasamy, V. A. Maroni, and R. W. Siegel. 1989. Mater. Res. Soc. Symp. Proc. 153, in press. J. Mat Res., Vol. 4, in press. Schaefer, H. E., R. Wurschum, M. Scheytt, R. Birringer, and H. Gleiter. 1987. Mater. Sci. Forum 15–18:955. Siegel, R. W., and H. Hahn. 1987. P. 403 in Current Trends in the Physics of Materials, M. Yussouff, ed. Singapore: World Scientific Publ. Siegel, R. W., S. Ramasamy, H. Hahn, Z. Li, T. Lu, and R. Gronsky. 1988. J. Mater. Res. 3:1367. Sinfelt, J. H., G. Via, and F. W. Lytle. 1984. Catal. Rev.-Sci. Eng. 26:81. Smith, J. D., et al. 1983. J. Catalysis 81:107. Stucky, G. D., and F. G. Dugen. 1984. P. 159 in ACS Symposium Series 218. Washington, D.C.: American Chemical Society. Thomas, G. J., R. W. Siegel, and J. A. Eastman. 1989. Mater. Res. Soc. Symp. Proc. 153, in press. Wallner, G., E. Jorra, H. Franz, J. Peisl, R. Birringer, H. Gleiter, T. Haubold, and W. Petry. 1989. Mater. Res. Soc. Symp. Proc. 132:149. 

CHARACTERIZATION METHODS. 69 Wang, P. K., J. P. Ansermet, S. L. Rudaz, Z. Wang, S. Shore, C. P. Slichter, and J. H. Sinfelt. 1986. Science 234:35. Zhu, X., R. Birringer, U. Herr, and H. Gleiter. 1987. Phys. Rev. 35:9085. 

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